发明名称 Semiconductor wafer front side protection
摘要 There is provided a method for making a wafer comprising the steps of providing a substrate having a first surface, an opposite second surface, and at least one side edge defining a thickness of the substrate, the at least one side edge having a first peripheral region and a second peripheral region adjacent to the first peripheral region. The method includes applying a fluid to the first surface and the first peripheral region of the at least one side edge and removing the opposite second surface and the second peripheral region of the at least one side edge to form a third surface. A semiconductor chip made from the method for making the wafer is also provided.
申请公布号 US7288465(B2) 申请公布日期 2007.10.30
申请号 US20050117122 申请日期 2005.04.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPOARTION 发明人 ABRAMS ALLAN D.;BROUILLETTE DONALD W.;DANAHER JOSEPH D.;KRYWANCZYK TIMOTHY C.;LAMOTHE RENE A.;STONE IVAN J.;WHALEN MATTHEW R.
分类号 H01L21/30;H01L21/301;H01L21/304;H01L21/46 主分类号 H01L21/30
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