发明名称 Post-deposition treatment to enhance properties of Si-O-C low k films
摘要 A method for providing a dielectric film having enhanced adhesion and stability. The method includes a post deposition treatment that densifies the film in a reducing atmosphere to enhance stability if the film is to be cured ex-situ. The densification generally takes place in a reducing environment while heating the substrate. The densification treatment is particularly suitable for silicon-oxygen-carbon low dielectric constant films that have been deposited at low temperature.
申请公布号 US7326657(B2) 申请公布日期 2008.02.05
申请号 US20040990251 申请日期 2004.11.15
申请人 APPLIED MATERIALS, INC. 发明人 XIA LI-QUN;GAILLARD FREDERIC;YIEH ELLIE;LIM TIAN H.
分类号 H01L21/31;C23C16/02;C23C16/40;C23C16/56;H01L21/3105;H01L21/314;H01L21/316 主分类号 H01L21/31
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