发明名称 Trench isolation structure for a semiconductor device with reduced sidewall stress and a method of manufacturing the same
摘要 By forming a non-oxidizable liner in isolation trenches, the creation of compressive stress may be significantly reduced, wherein, in illustrative embodiments, silicon nitride may be used as liner material. For this purpose, the etch behavior of the silicon nitride may be efficiently modified on the basis of an appropriate surface treatment, thereby providing a high degree of material integrity during a subsequent etch process for removing non-modified portions of silicon nitride, which may also be used as an efficient CMP stop layer.
申请公布号 US7358150(B2) 申请公布日期 2008.04.15
申请号 US20060532967 申请日期 2006.09.19
申请人 ADVANCED MICRO DEVICES, INC. 发明人 HEMPEL KLAUS;KRUEGEL STEPHAN;PRUEFER EKKEHARD
分类号 H01L21/76 主分类号 H01L21/76
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