| 摘要 |
The present invention relates to a semiconductor device of a wafer level, a semiconductor system including the same, and a method for testing the semiconductor system. Provided is the semiconductor system comprising the semiconductor device, which outputs a valid signal synchronized in a predetermined edge of a system clock every predetermined operation cycle, and a test device which generates a system clock for controlling a transition time point of a predetermined edge by a predetermined level each of the predetermined operation cycles and measures a predetermined parameter of the semiconductor device based on the valid signal. |
