发明名称 Photoresist underlayer film-forming composition and pattern forming process
摘要 In lithography, a composition comprising a novolak resin comprising recurring units of hydroxycoumarin is used to form a photoresist underlayer film. The underlayer film is strippable in alkaline water, without causing damage to ion-implanted Si substrates or SiO 2 substrates.
申请公布号 EP2813891(A3) 申请公布日期 2015.01.07
申请号 EP20140171748 申请日期 2014.06.10
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA, JUN;KORI, DAISUKE;OGIHARA, TSUTOMU
分类号 G03F7/09;G03F7/075;G03F7/42 主分类号 G03F7/09
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