发明名称 |
A VISION INSPECTION AND MARKING SYSTEM OF THE SEMICONDUCTOR PACKAGE |
摘要 |
<p>The present invention relates to a vision inspection and marking system for a semiconductor package having improved accuracy in vision inspection and marking as deflection of the semiconductor package adsorbed onto an adsorption fixing means by a rubber pad installed on an adsorption plate is automatically corrected. The vision inspection and marking system for a semiconductor package according to the present invention comprises: a circulating device; a moving and arranging supply device; a substrate adsorption moving device composed of an adsorption fixing means; a moving picker unit; a vision reading information on a semiconductor package which is installed in the moving picker unit and is moved and arranged; a marking device composed of a first making unit and a second marking unit; and a cleaning device removing foreign substances from the semiconductor package.</p> |
申请公布号 |
KR101479039(B1) |
申请公布日期 |
2015.01.07 |
申请号 |
KR20140145127 |
申请日期 |
2014.10.24 |
申请人 |
GENESEM INC. |
发明人 |
HAN, BOK WOO;CHO, YOON KI |
分类号 |
G01N21/88;B23K26/362;H01L21/66;H01L21/677 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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