发明名称 |
INTERACTIVE TEST DEVICE AND APPARATUS WITH TIMING MECHANISM |
摘要 |
A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result. |
申请公布号 |
EP2820420(A1) |
申请公布日期 |
2015.01.07 |
申请号 |
EP20130711996 |
申请日期 |
2013.03.01 |
申请人 |
QUIDEL CORPORATION |
发明人 |
DE CALLIER, RHYS;EGAN, RICHARD, L.;FERENCZY, WILLIAM, J.;HALE, MICHAEL, JON |
分类号 |
G01N33/52;G01N33/558 |
主分类号 |
G01N33/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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