发明名称 THICK FILM PHOTORESISTS AND METHODS FOR USE THEREOF
摘要 New methods and compositions are provided that enable application and processing of photoresist as thick coating layers, e.g. at dried layer (post soft-bake) thicknesses of in excess of 2 microns. Resists can be imaged at short wavelengths in accordance with the invention, including 248 nm.
申请公布号 KR20090036153(A) 申请公布日期 2009.04.13
申请号 KR20097006655 申请日期 2009.03.31
申请人 ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. 发明人 THACKERAY JAMES W.;MORI JAMES M.;TENG GARY GANGHUI
分类号 G03F7/004;G03F7/039;G03F7/16;G03F7/26;G03F7/38;H01L21/027 主分类号 G03F7/004
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