发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing an SGT (Surrounding Gate Transistor) which reduces parasitic capacitance between gate wiring and a substrate and which directly connects metal wiring and an upper part of a columnar silicon layer without forming a contact on an upper part of the columnar silicon layer, and to provide a structure of the SGT obtained by result of the method.SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: forming a fin-shaped silicon layer on a silicon substrate; forming a first insulation film around the fin-shaped silicon layer; forming a columnar silicon layer on an upper part of the fin-shaped silicon layer; forming a gate insulation film formed around the columnar silicon layer, a gate electrode formed around the gate insulation film and gate wiring connected to the gate electrode; forming a first diffusion layer formed on an upper part of the columnar silicon layer and a second diffusion layer on a lower part of the columnar silicon layer and the upper part of the fin-shaped silicon layer; forming a first silicide and a second silicide on the first diffusion layer and the second diffusion layer; depositing an interlayer insulation film; and planarizing the interlayer insulation film.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016105525(A) |
申请公布日期 |
2016.06.09 |
申请号 |
JP20160048836 |
申请日期 |
2016.03.11 |
申请人 |
UNISANTIS ELECTRONICS SINGAPORE PTE LTD |
发明人 |
MASUOKA FUJIO;NAKAMURA HIROKI |
分类号 |
H01L21/336;H01L21/28;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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