发明名称 SELF-ALIGNED TRENCH FORMATION
摘要 <p>Methods for forming a semiconductor device include forming self-aligned trenches, in which a first set of trenches is used to align a second set trenches. Methods taught herein can be used as a pitch doubling technique, and may therefore enhance device integration. Further, employing a very thin CMP stop layer, and recessing surrounding materials by about an equal amount to the thickness of the CMP stop layer, provides improved planarity at the surface of the device.</p>
申请公布号 KR101477337(B1) 申请公布日期 2015.01.06
申请号 KR20117008220 申请日期 2009.08.14
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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