发明名称 |
Randomized value generation |
摘要 |
A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process. |
申请公布号 |
US8930427(B2) |
申请公布日期 |
2015.01.06 |
申请号 |
US201113067470 |
申请日期 |
2011.06.02 |
申请人 |
The Regents of the University of Michigan |
发明人 |
Liu Nurrachman Chih Yeh;Hanson Scott M;Pinckney Nathaniel;Blaauw David T;Sylvester Dennis M. |
分类号 |
G06F7/58;H03K3/84;H04L9/00;H04L9/08 |
主分类号 |
G06F7/58 |
代理机构 |
Nixon & Vanderhye P.C. |
代理人 |
Nixon & Vanderhye P.C. |
主权项 |
1. The data processing apparatus comprising:
a cell comprising a dielectric oxide layer; stress voltage circuitry configured to apply a stress voltage across said dielectric oxide layer of said cell to cause an oxide breakdown process to occur; oxide breakdown detection circuitry configured to determine a current extent of said oxide breakdown process by measuring a response of said dielectric oxide layer to said stress voltage; and randomized value determination circuitry configured to determine a randomized value in dependence on said current extent of said oxide breakdown process, wherein said randomized value determination circuitry is configured to determine said randomized value in dependence on a time period measurement of a time period between application of said stress voltage and determination by said oxide breakdown detection circuitry of occurrence of an oxide breakdown event, said oxide breakdown event corresponding to a predetermined extent of said oxide breakdown process. |
地址 |
Ann Arbor MI US |