Compliant printed circuit socket diagnostic tool

摘要

Diagnostic tools for testing integrated circuit (IC) devices, and a method of making the same. The first diagnostic tool includes a first compliant printed circuit with a plurality of contact pads configured to form an electrical interconnect at a first interface between proximal ends of contact members in the socket and contact pads on a printed circuit board (PCB). A plurality of printed conductive traces electrically couple to a plurality of the contact pads on the first compliant printed circuit. A plurality of electrical devices are printed on the first compliant printed circuit at a location external to the first interface. The electrical devices are electrically coupled to the conductive traces and programmed to provide one or more of continuity testing at the first interface or functionality of the IC devices. A second diagnostic tool includes a second compliant printed circuit electrically coupled to a surrogate IC device.

主权项

1. A diagnostic system for testing integrated circuit (IC) devices adapted to couple to a printed circuit board (PCB) by a socket or capable of evaluating an interface at the socket, the diagnostic system comprising:
a first diagnostic tool adapted to be located at a first interface between the socket and the PCB, the first diagnostic tool comprising; a first compliant printed circuit comprising a first flexible polymeric sheet with a plurality of contact pads configured to form an electrical interconnect at the first interface at proximal ends of contact members in the socket and contact members configured to form an electrical interconnection with contact pads on the PCB, wherein the first compliant printed circuit acts as an electrical interconnect between the contact members in the socket and the contact pads on the PCB; a plurality of printed conductive traces electrically coupled to a plurality of the contact pads on the first compliant printed circuit; a plurality of electrical devices located on the first compliant printed circuit at a position external to the first interface, the electrical devices electrically coupled to the conductive traces and programmed to provide one or more of continuity testing at the first interface or functionality testing of IC devices located in the socket; and a second diagnostic tool including a surrogate IC device having a plurality of contact pads configured to form an electrical interconnect with distal ends of the contact members in the socket at a second interface.