发明名称 pBIST read only memory image compression
摘要 A programmable Built In Self Test (pBIST) system used to test embedded memories where a plurality of memories requiring different testing conditions are incorporated in an SOC. The pBIST Read Only Memory storing the test setup data is organized to eliminate multiple instances of test setup data for similar embedded memories.
申请公布号 US8930783(B2) 申请公布日期 2015.01.06
申请号 US201213709188 申请日期 2012.12.10
申请人 Texas Instruments Incorporated 发明人 Damodaran Raguram;Bhoria Naveen;Kokrady Aman
分类号 G01R31/28;G11C29/12;G01R31/3185;G11C29/36 主分类号 G01R31/28
代理机构 代理人 Marshall, Jr. Robert D.;Telecky, Jr. Frederick J.
主权项 1. A System On Chip disposed on a single integrated circuit having an embedded memory test system comprising: a plurality of embedded random access memories having a plurality of memory types; a read only memory storing instructions for testing each of the plurality of types of embedded random access memories and data for testing the embedded random access memories; and a programmable Built In Self Test (pBIST) engine coupled to each of the plurality of embedded random access memories and to the read only memory, the pBIST engine operable to test each of the plurality of embedded random access memories employing instructions stored in the read only memory corresponding to the memory type of the embedded random access memory and data stored in the read only memory.
地址 Dallas TX US