发明名称 Self-aligned split gate flash memory having liner-separated spacers above the memory gate
摘要 Some embodiments of the present disclosure relate to a split gate memory cell which includes a select gate and a memory gate. The select gate has a planar upper surface disposed over a semiconductor substrate and is separated from the substrate by a gate dielectric layer. The memory gate has a planar upper surface arranged at one side of the select gate and is separated from the substrate by a charge trapping layer. The charge trapping layer extends under the memory gate. A first spacer is disposed above the memory gate and is separated from the memory gate by a first dielectric liner. The first dielectric liner extends upwardly along an upper sidewall of the charge trapping layer; and source/drain regions are disposed in the semiconductor substrate at opposite sides of the select gate and the memory gate.
申请公布号 US9391085(B2) 申请公布日期 2016.07.12
申请号 US201414454872 申请日期 2014.08.08
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Huang Wei-Hang;Wu Chang-Ming;Liu Shih-Chang
分类号 H01L29/66;H01L27/115;H01L29/792;H01L29/423;H01L29/51;H01L21/28;H01L29/45;H01L21/02 主分类号 H01L29/66
代理机构 Eschweiler & Associates, LLC 代理人 Eschweiler & Associates, LLC
主权项 1. A split gate memory cell, comprising: a select gate with a planar upper surface disposed over a semiconductor substrate, separated therefrom by a gate dielectric layer; a memory gate with a planar upper surface arranged at one side of the select gate, separated therefrom by a charge trapping layer, wherein the charge trapping layer extends under the memory gate; a first spacer disposed above the memory gate, separated therefrom by a first dielectric liner, wherein the first dielectric liner comprises an upwardly-extending portion in lateral contact with an upper sidewall of the charge trapping layer; and source/drain regions disposed in the semiconductor substrate at opposite sides of the select gate and the memory gate.
地址 Hsin-Chu TW