发明名称 Device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM
摘要 The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power. The present invention is characterized by a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, the device consisting essentially of: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an electron multiplier inducing and amplifying the initial electron emission of ultraviolet photons from the ultraviolet diode and obtaining a large amount of electron beams from the exit; an electron condenser lens condensing the electron beams amplified by the electron multiplier; an ion trap mass separator ionizing gas sample molecules by the electron beams injected through the electron xondensing lens; and an ion detector detecting ions separated from the ion trap mass separator by mass spectrum, wherein the electron multiplier is a CEM module.
申请公布号 US8927943(B2) 申请公布日期 2015.01.06
申请号 US201114125491 申请日期 2011.12.16
申请人 Korea Basic Science Institute 发明人 Yang Mo;Kim Seung Yong;Kim Hyun Sik
分类号 H01J49/10;H01J49/00;H01J49/08;H01J49/42 主分类号 H01J49/10
代理机构 Rabin & Berdo, P.C. 代理人 Rabin & Berdo, P.C.
主权项 1. A device for acquiring an ion source of a mass analyzer, the device comprising: an ultraviolet (UV) diode emitting UV, a quantity of the UV being adjusted by an emission time and intensity of the UV; an electron multiplier (EM) module in which UV photons emitted from the UV diode induces an initial electron emission, amplifies electrons emitted by the initial electron emission and obtains a large quantity of electron beam at an outlet thereof; an electron beam focusing lens focusing the large quantity of electron beam amplified through the EM module; an ion trap mass separator ionizing gaseous molecules to produce ions using the large quantity of electron beam injected through the electron beam focusing lens; and an ion detector detecting the ions produced by the ion trap mass separator based on a mass spectrum; a first insulator disposed in an inlet side of the EM module for applying a first negative voltage to the inlet side; and a second insulator disposed in an outlet side of the EM module for applying a second negative voltage to the outlet side, the second insulator being separated from the first insulator, wherein the first negative voltage is in a range of −500 V to −2500 V, and the second negative voltage is in a range of −10 V to −500 V.
地址 Daejeon KR