发明名称 |
Semiconductor devices having through-vias and methods for fabricating the same |
摘要 |
Semiconductor devices having through-vias and methods for fabricating the same are described. The method may include forming a hole opened toward a top surface of a substrate and partially penetrating the substrate, forming a sacrificial layer partially filling the hole, forming a through-via in the hole partially filled with the sacrificial layer, forming a via-insulating layer between the through-via and the substrate, and exposing the through-via through a bottom surface of the substrate. Forming the sacrificial layer may include forming an insulating flowable layer on the substrate, and constricting the insulating flowable layer to form a solidified flowable layer. |
申请公布号 |
US8927426(B2) |
申请公布日期 |
2015.01.06 |
申请号 |
US201313766326 |
申请日期 |
2013.02.13 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Ho-Jin;Kang Pil-Kyu;Lee Kyu-Ha;Choi Gilheyun;Choi YongSoon;Park Byung Lyul;Chung Hyunsoo |
分类号 |
H01L21/302;H01L29/40;H01L23/48;H01L21/768;H01L25/065;H01L23/00;H01L23/31 |
主分类号 |
H01L21/302 |
代理机构 |
Myers Bigel Sibley & Sajovec, PA |
代理人 |
Myers Bigel Sibley & Sajovec, PA |
主权项 |
1. A semiconductor device comprising:
a substrate having an active surface, a non-active surface, and a via-hole extending from the active surface to the non-active surface; a through-via provided in the via-hole; a via-insulating layer extending along an inner sidewall of the via-hole and surrounding a sidewall of the through-via; a sacrificial layer extending along the inner sidewall of the via-hole from the via-insulating layer to the non-active surface of the substrate; a lower insulating layer covering the non-active surface of the substrate; and a terminal provided on the lower insulating layer and electrically connected to the through-via. |
地址 |
KR |