发明名称 |
High-mobility multiple-gate transistor with improved on-to-off current ratio |
摘要 |
A multi-gate transistor includes a semiconductor fin over a substrate. The semiconductor fin includes a central fin formed of a first semiconductor material; and a semiconductor layer having a first portion and a second portion on opposite sidewalls of the central fin. The semiconductor layer includes a second semiconductor material different from the first semiconductor material. The multi-gate transistor further includes a gate electrode wrapping around sidewalls of the semiconductor fin; and a source region and a drain region on opposite ends of the semiconductor fin. Each of the central fin and the semiconductor layer extends from the source region to the drain region. |
申请公布号 |
US8927371(B2) |
申请公布日期 |
2015.01.06 |
申请号 |
US201414157638 |
申请日期 |
2014.01.17 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Ko Chih-Hsin;Wann Clement Hsingjen |
分类号 |
H01L29/00;H01L29/66;H01L29/78;H01L29/812 |
主分类号 |
H01L29/00 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A method comprising:
forming a semiconductor fin comprising:
forming a central fin comprising a first semiconductor material; andforming a semiconductor layer comprising a first portion and a second portion on opposite sidewalls of the central fin, wherein the semiconductor layer comprises a second semiconductor material different from the first semiconductor material; forming a gate electrode on sidewalls of the semiconductor fin; and forming a source region and a drain region on opposite ends of the semiconductor fin, wherein each of the central fin and the semiconductor layer extends from the source region to the drain region. |
地址 |
Hsin-Chu TW |