发明名称 High-mobility multiple-gate transistor with improved on-to-off current ratio
摘要 A multi-gate transistor includes a semiconductor fin over a substrate. The semiconductor fin includes a central fin formed of a first semiconductor material; and a semiconductor layer having a first portion and a second portion on opposite sidewalls of the central fin. The semiconductor layer includes a second semiconductor material different from the first semiconductor material. The multi-gate transistor further includes a gate electrode wrapping around sidewalls of the semiconductor fin; and a source region and a drain region on opposite ends of the semiconductor fin. Each of the central fin and the semiconductor layer extends from the source region to the drain region.
申请公布号 US8927371(B2) 申请公布日期 2015.01.06
申请号 US201414157638 申请日期 2014.01.17
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Ko Chih-Hsin;Wann Clement Hsingjen
分类号 H01L29/00;H01L29/66;H01L29/78;H01L29/812 主分类号 H01L29/00
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method comprising: forming a semiconductor fin comprising: forming a central fin comprising a first semiconductor material; andforming a semiconductor layer comprising a first portion and a second portion on opposite sidewalls of the central fin, wherein the semiconductor layer comprises a second semiconductor material different from the first semiconductor material; forming a gate electrode on sidewalls of the semiconductor fin; and forming a source region and a drain region on opposite ends of the semiconductor fin, wherein each of the central fin and the semiconductor layer extends from the source region to the drain region.
地址 Hsin-Chu TW