发明名称 Method and device for bonding two wafers
摘要 A device for bonding of two wafers on one joining surface V of the wafers. The device includes a pressure transfer means with a pressure surface D for applying a bond pressure to the two wafers on the pressure surface D, wherein the pressure surface D is smaller than the joining surface V. The invention also relates to a method for bonding of two wafers on one joining surface V of the two wafers, by pressure transfer means with a pressure surface D for action on the wafers (2, 3), wherein a bond pressure is applied in succession to partial sections of the joining surface V.
申请公布号 US8926775(B2) 申请公布日期 2015.01.06
申请号 US201214113256 申请日期 2012.03.30
申请人 发明人 Thallner Erich
分类号 B32B37/00;H01L21/71;H01L21/67;H01L21/18;H01L21/20 主分类号 B32B37/00
代理机构 Kusner & Jaffe 代理人 Kusner & Jaffe
主权项 1. A device for bonding first and second wafers such that each of said first and second wafers are joined to each other, directly or indirectly, at a joining surface V located between the first and second wafers, said device comprising: a holder for holding the first wafer having first and second surfaces, the second surface facing the holder; pressure transfer means having a pressure surface D that contacts a first surface of the second wafer for applying a bond pressure to the first and second wafers, said pressure surface D is smaller than the joining surface V, wherein a second surface of the second wafer faces toward the first surface of the first wafer; and means for contacting the pressure surface D, in succession, with a plurality of partial sections of the first surface of the second wafer, thereby applying the bond pressure at a respective plurality of partial sections of the joining surface V.
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