| 摘要 |
<p>PROBLEM TO BE SOLVED: To increase the accuracy of determining the transition to a test mode.SOLUTION: A semiconductor device of the present invention includes a first circuit and a second circuit. The first circuit includes a plurality of transistors connected in series. For a transistor on one end, an input terminal is connected to a drain; for a transistor on another end, a third voltage is applied to a gate and a fourth voltage is applied to a source, causing conduction; transistors other than the one on the other side are diode-connected; and a drain voltage other than that of a first transistor is output as a first voltage. The second circuit includes a plurality of transistors connected in series. For a transistor on one end, a power supply voltage is applied to a drain; for a transistor on another end, a third voltage is applied to a gate and a fourth voltage is applied to a source, causing conduction; transistors other than the one on the other end are diode-connected; and a drain voltage other than that of a third transistor is output as a second voltage. The semiconductor device makes the transition to the test mode according to a result of comparison between the first voltage and second voltage.</p> |
