发明名称 SEMICONDUCTOR DEVICE HAVING DUTY CORRECTION CIRCUIT
摘要 Disclosed herein is a device includes a duty correction circuit adjusting a duty ratio of a first clock signal based on a duty control signal to generate a second clock signal; a delay line delaying the second clock signal to generate a third clock signal; and a duty cycle detector detecting the duty ratio of the second clock signal to generate the duty control signal in a first mode, and detecting the duty ratio of the third clock signal to generate the duty control signal in a second mode.
申请公布号 US2015002201(A1) 申请公布日期 2015.01.01
申请号 US201414318067 申请日期 2014.06.27
申请人 MICRON TECHNOLOGY, INC. 发明人 Kitagawa Katsuhiro;Takahashi Hiroki
分类号 H03K3/017 主分类号 H03K3/017
代理机构 代理人
主权项 1. A semi conduct or device comprising: a duty correction circuit adjusting a duty ratio of a first clock signal based, on a duty control, signal to generate a second clock signal; a delay line delaying the second clock signal to generate a third clock signal; and a duty cycle detector detecting the duty ratio of the second clock signal to generate the duty control signal in a first mode, and detecting the duty ratio of the third clock signal to generate the duty control signal in a second mode.
地址 BOISE ID US