发明名称 |
METHOD FOR MEASURING AN ANGLE BETWEEN TWO SPATIALLY SEPARATED ELEMENTS |
摘要 |
Some embodiments of the invention relate to a method for measuring an angle between two spatially separated elements having the steps: preparing a multiplex hologram having a plurality of interference patterns, at least two having different angles of incidence of an object light wave onto a hologram plane; arranging the multiplex hologram in a first element plane on a first element; lighting the multiplex hologram with a reference light wave; arranging a light detector in a second element plane on a second element; detecting a reference light wave refracted on an interference pattern with a light detector; creating an intensity pattern from the detected refracted reference light wave; assigning the angle of incidence stored as machine readable data to the intensity pattern; and/or calculating an angle between the first element plane and the second element plane from the assigned angle of incidence. |
申请公布号 |
US2015002840(A1) |
申请公布日期 |
2015.01.01 |
申请号 |
US201314372726 |
申请日期 |
2013.01.16 |
申请人 |
HEXAGON TECHNOLOGY CENTER GMBH |
发明人 |
Pettersson Bo;Przygodda Frank;Siercks Knut |
分类号 |
G01B11/26 |
主分类号 |
G01B11/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Heerbrugg CH |