发明名称 |
METHOD FOR FORMING TiN AND STORAGE MEDIUM |
摘要 |
When forming a TiN film to be formed as a metallic hard mask for etching a film formed on a substrate to be processed, a first step and a second step are repeated a plurality of times to form a TiN film having reduced film stress. In the first step (step 1), the substrate to be processed is conveyed into a processing chamber, TiCl4 gas and a nitriding gas are fed into the processing chamber, the interior of which being kept in a depressurized state during this time, and a plasma from the gases is generated to form a TiN unit film. In the second step (step 2), a nitriding gas is fed into the processing container, a plasma of the gas is generated, and the TiN unit film is subjected to plasma nitriding. |
申请公布号 |
US2015004803(A1) |
申请公布日期 |
2015.01.01 |
申请号 |
US201214370732 |
申请日期 |
2012.12.12 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
Yamasaki Hideaki;Yamamoto Takeshi |
分类号 |
H01L21/033;H01L21/02 |
主分类号 |
H01L21/033 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a TiN film to be used as a metallic hard mask in etching of an etching target film formed on a substrate to be processed, the method comprising:
alternately repeating a step of forming a TiN unit film and a step of performing a plasma nitriding process on the TiN unit film to form a TiN film having a reduced film stress, wherein the step of forming the TiN unit film is performed by loading the substrate to be processed into a processing chamber, supplying TiCl4 gas and a nitriding gas into the processing chamber while maintaining an inside of the processing chamber in a depressurized state, and generating a plasma from the TiCl4 gas and the nitriding gas, and wherein the step of performing the plasma nitriding process is performed by supplying a nitriding gas into the processing chamber and generating a plasma from the nitriding gas. |
地址 |
Tokyo JP |