发明名称 METHOD FOR FORMING TiN AND STORAGE MEDIUM
摘要 When forming a TiN film to be formed as a metallic hard mask for etching a film formed on a substrate to be processed, a first step and a second step are repeated a plurality of times to form a TiN film having reduced film stress. In the first step (step 1), the substrate to be processed is conveyed into a processing chamber, TiCl4 gas and a nitriding gas are fed into the processing chamber, the interior of which being kept in a depressurized state during this time, and a plasma from the gases is generated to form a TiN unit film. In the second step (step 2), a nitriding gas is fed into the processing container, a plasma of the gas is generated, and the TiN unit film is subjected to plasma nitriding.
申请公布号 US2015004803(A1) 申请公布日期 2015.01.01
申请号 US201214370732 申请日期 2012.12.12
申请人 TOKYO ELECTRON LIMITED 发明人 Yamasaki Hideaki;Yamamoto Takeshi
分类号 H01L21/033;H01L21/02 主分类号 H01L21/033
代理机构 代理人
主权项 1. A method of forming a TiN film to be used as a metallic hard mask in etching of an etching target film formed on a substrate to be processed, the method comprising: alternately repeating a step of forming a TiN unit film and a step of performing a plasma nitriding process on the TiN unit film to form a TiN film having a reduced film stress, wherein the step of forming the TiN unit film is performed by loading the substrate to be processed into a processing chamber, supplying TiCl4 gas and a nitriding gas into the processing chamber while maintaining an inside of the processing chamber in a depressurized state, and generating a plasma from the TiCl4 gas and the nitriding gas, and wherein the step of performing the plasma nitriding process is performed by supplying a nitriding gas into the processing chamber and generating a plasma from the nitriding gas.
地址 Tokyo JP