发明名称 |
DEVICE WITH CAPACITIVE SECURITY SHIELD |
摘要 |
The invention provides a semiconductor device comprising with a capacitive security shield structure which uses a set of randomly distributed dielectric or conducting particles formed within a dielectric layer. A set of electrodes can be configured as at least two sets, wherein a first set is used to measure a capacitance characteristic, and a second set is configured as non-measurement set. The electrode configuration can be altered so that multiple measurements can be obtained. |
申请公布号 |
US2015007353(A1) |
申请公布日期 |
2015.01.01 |
申请号 |
US201414293730 |
申请日期 |
2014.06.02 |
申请人 |
NXP B.V. |
发明人 |
Franciscus Widdershoven Franciscus;Nguyen Viet |
分类号 |
G06F21/87;H01L23/00 |
主分类号 |
G06F21/87 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising a capacitive security shield, the capacitive security shield comprising:
a set of randomly distributed dielectric or conducting particles formed within a dielectric layer; a set of electrodes formed in a layer over which the set of particles are formed; and a controller, wherein the controller is adapted to configure the electrodes as at least two sets, wherein a first set is used to measure a capacitance characteristic, and a second set is configured as a non-measurement set, wherein the controller is further adapted to reconfigure the electrodes into a different first and second set, and the reconfigured first set is used to measure a reconfigured capacitance characteristic. |
地址 |
Eindhoven NL |