| 发明名称 |
MEASUREMENT PROBE PROVIDING DIFFERENT LEVELS OF AMPLIFICATION FOR SIGNALS OF DIFFERENT MAGNITUDE |
| 摘要 |
A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude. |
| 申请公布号 |
US2015002136(A1) |
申请公布日期 |
2015.01.01 |
| 申请号 |
US201313930179 |
申请日期 |
2013.06.28 |
| 申请人 |
Keysight Technologies, Inc. |
发明人 |
McTigue Michael T.;Johnson Kenneth W.;Brush, IV Edward Vernon |
| 分类号 |
G01R1/30;G01R19/00 |
主分类号 |
G01R1/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measurement probe, comprising:
at least one input port configured to receive an input signal generated in relation to a device under test (DUT); and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude. |
| 地址 |
Minneapolis MN US |
