| 摘要 |
A vertical microcavity (1) has a layer structure perpendicular to a vertical axis z, the layer structure comprising: a first reflector (100) and a second reflector (200), each comprising one or more material layers (111-131, 211-231) and being preferably a Bragg reflector, a confinement layer (10) separating the first and second reflectors, wherein an electromagnetic wave can be substantially confined, and wherein, the confinement layer comprises a body (12) and a defect (20), said defect delimited by two surfaces, a first surface (si) and a second surface (s2), each of said two surfaces being perpendicular to the vertical axis z, wherein, one (si) of said two surfaces is contiguous with said body (12), the other one (s2) of said two surfaces being contiguous with a layer (211) of the first or second reflector, and wherein one (s1) of said two surfaces is curved, such as to have a curved profile (21, 21', 22) in at least a plane section ((y, z), (x, z)) perpendicular to the layer structure, said curved profile having a vertex (25), which defines a maximal thickness h0 of the defect between the first surface and the second surface in said plane section, said maximal thickness h0 being less than a thickness of said contiguous layer (211). |
