发明名称 |
Method and apparatus for measuring bowing of single-crystal substrate |
摘要 |
<p>At least two values of an X-ray irradiation width are set for a single specimen. A rocking curve is measured for each of the X-ray irradiation widths. A value of a rocking curve width is determined for each of the rocking curves. The values of the X-ray irradiation width and the values of the rocking curve width are plotted on a planar coordinate system having a vertical axis representing the rocking curve width value and a horizontal axis representing the X-ray irradiation width value, and a rocking curve width shift line is determined based on the plotted points. A gradient of the rocking curve width shift line is determined. A curvature radius of the specimen is determined based on the gradient. The amount: of bowing of a single-crystal substrate under measurement can be measured without a need to move the single-crystal substrate for reliable measurement with a small amount of error.</p> |
申请公布号 |
GB2515613(A) |
申请公布日期 |
2014.12.31 |
申请号 |
GB20140006440 |
申请日期 |
2014.04.10 |
申请人 |
RIGAKU CORPORATION |
发明人 |
KATSUHIKO INABA;SHINTARO KOBAYASHI;TORU MITSUNAGA |
分类号 |
G01B15/04;G01B15/06;G01N23/083;G01N23/207 |
主分类号 |
G01B15/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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