发明名称 Moisture resistant photovoltaic devices with exposed conductive grid
摘要 The present invention provides strategies for improving the adhesion among two or more of transparent conducting oxides, electrically conductive grid materials, and dielectric barrier layers. As a consequence, these strategies are particularly useful in the fabrication of heterojunction photovoltaic devices such as chalcogenide-based solar cells. When the barrier is formed and then the grid is applied to vias in the barrier, the structure has improved moisture barrier resistance as compared to where the barrier is formed over or around the grid. Adhesion is improved to such a degree that grid materials and dielectric barrier materials can cooperate to provide a hermetic seal over devices to protect against damage induced by environmental conditions, including damage due to water intrusion. This allows the collection grids to be at least partially exposed above the dielectric barrier, making it easy to make electronic connection to the devices.
申请公布号 US8921148(B2) 申请公布日期 2014.12.30
申请号 US201113005426 申请日期 2011.01.12
申请人 Dow Global Technologies LLC 发明人 Elowe Paul R.;DeGroot Marty W.;Mills Michael E.;Stempki Matt A.
分类号 H01L21/00;H01L31/00;H01L31/0216;H01L31/0224;H01L31/032;H01L31/0749 主分类号 H01L21/00
代理机构 Kagan Binder, PLLC 代理人 Kagan Binder, PLLC
主权项 1. A method of making a photovoltaic device, comprising the steps of: a) providing a substrate having a light incident surface and a backside surface and comprising at least one photovoltaic absorber, wherein the substrate includes at least one transparent conducting oxide layer interposed between the absorber and the light incident surface and wherein the at least one photovoltaic absorber comprises a chalcogenide-containing photovoltaic absorber having a thickness of 5 micrometers or less; b) causing a dielectric barrier layer to be positioned over the transparent conducting oxide layer; c) forming at least one via in the dielectric barrier layer that terminates at a location in the device such that the via provides open communication to the transparent conducting oxide layer through the dielectric barrier layer without penetrating all the way through the transparent conducting oxide layer; and d) forming an electrical contact that is electrically connected to the transparent conducting oxide layer, said electrical contact comprising a base formed in the via and a cap projecting above the dielectric barrier layer, wherein the cap of the electrical contact is wider than the base of the electrical contact in at least one dimension.
地址 Midland MI US