| 摘要 |
20 DeviceforDeterminingtheLocationofMechanicalElements Abstract Theinventionrelatestoadevicefordeterminingthelocationofafirstmechanicalelement (10)anda secondmechanicalelement(12)withrespecttoeachother,havingafirstmeasurement unit (14)for positioningatthefirstmechanicalelement,asecondmeasurement unit(18)forpositioningatthesecond mechanicalelement,andananalysisunit (22),whereinthefirstmeasurement unithas means(24)for producingat leastonelightbeambundle(28, 30),ascatteringsurface(34)forscatteringthelight (WV, PV)impingingonthescatteringsurface,andacamera(36)forrecordingimagesofthescattering surface, whereinthesecondmeasurementunit hasareflectorarrangement(38),whichfacesthefirst measurement unit whenthemeasurement unitsarepositionedattherespectivemechanicalelement so astoreflectthelightbeambundle(28', 28/")ontothescatteringsurface,andwhereintheanalysisunit is designedtodeterminefromtheimagedatasuppliedbythecamerathepositionofimpingement ofthe lightbeambundle,reflectedatthereflectorarrangement,onthescatteringsurfaceandfromitthe locationofthefirstmechanicalelement andthesecondmechanicalelement withrespecttoeachother. (Fig. 1) |
