| 发明名称 |
TESTER AND TEST SYSTEM INCLUDING THE SAME |
| 摘要 |
Provided are a tester configured to test a semiconductor device and a test system including the same. The tester may include at least one contact unit and at least one memory controller. The contact unit is in contact with the semiconductor device. The memory controller is connected to the contact unit. The memory controller controls data input/output (I/O) operations of the semiconductor device and tests the semiconductor device. |
| 申请公布号 |
US2014375349(A1) |
申请公布日期 |
2014.12.25 |
| 申请号 |
US201414484777 |
申请日期 |
2014.09.12 |
| 申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
LEE Chang-hwan |
| 分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A tester for testing semiconductor devices, comprising:
at least one integrated controller; and at least one contact unit, each of the at least one contact unit being configured to be electrically connected to one of the at least one integrated controller and electrically connected to one of the semiconductor devices, wherein each of the at least one integrated controller is configured to integrate functions of at least two controllers corresponding to at least two different type of semiconductor devices. |
| 地址 |
Suwon-si KR |
