发明名称 ANISOTROPIC STRAIN CONTROL IN SEMIPOLAR NITRIDE QUANTUM WELLS BY PARTIALLY OR FULLY RELAXED ALUMINUM INDIUM GALLIUM NITRIDE LAYERS WITH MISFIT DISLOCATIONS
摘要 An epitaxial structure for a III-Nitride based optical device, comprising an active layer with anisotropic strain on an underlying layer, where a lattice constant and strain in the underlying layer are partially or fully relaxed in at least one direction due to a presence of misfit dislocations, so that the anisotropic strain in the active layer is modulated by the underlying layer.
申请公布号 US2014376584(A1) 申请公布日期 2014.12.25
申请号 US201414482760 申请日期 2014.09.10
申请人 The Regents of the University of California 发明人 Ohta Hiroaki;Wu Feng;Tyagi Anurag;Chakraborty Arpan;Speck James S.;DenBaars Steven P.;Nakamura Shuji;Young Erin C.
分类号 H01S5/343;H01S5/34 主分类号 H01S5/343
代理机构 代理人
主权项 1. A device structure, comprising: a semipolar or nonpolar III-Nitride active layer formed on or above an at least partially relaxed III-nitride layer, wherein the semipolar or nonpolar III-Nitride active layer is strained with respect to the at least partially relaxed III-nitride layer.
地址 Oakland CA US