发明名称 |
ANISOTROPIC STRAIN CONTROL IN SEMIPOLAR NITRIDE QUANTUM WELLS BY PARTIALLY OR FULLY RELAXED ALUMINUM INDIUM GALLIUM NITRIDE LAYERS WITH MISFIT DISLOCATIONS |
摘要 |
An epitaxial structure for a III-Nitride based optical device, comprising an active layer with anisotropic strain on an underlying layer, where a lattice constant and strain in the underlying layer are partially or fully relaxed in at least one direction due to a presence of misfit dislocations, so that the anisotropic strain in the active layer is modulated by the underlying layer. |
申请公布号 |
US2014376584(A1) |
申请公布日期 |
2014.12.25 |
申请号 |
US201414482760 |
申请日期 |
2014.09.10 |
申请人 |
The Regents of the University of California |
发明人 |
Ohta Hiroaki;Wu Feng;Tyagi Anurag;Chakraborty Arpan;Speck James S.;DenBaars Steven P.;Nakamura Shuji;Young Erin C. |
分类号 |
H01S5/343;H01S5/34 |
主分类号 |
H01S5/343 |
代理机构 |
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代理人 |
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主权项 |
1. A device structure, comprising:
a semipolar or nonpolar III-Nitride active layer formed on or above an at least partially relaxed III-nitride layer, wherein the semipolar or nonpolar III-Nitride active layer is strained with respect to the at least partially relaxed III-nitride layer. |
地址 |
Oakland CA US |