发明名称 MEASURING APPARATUS, MEASURING SYSTEM, AND MEASURING METHOD
摘要 A measuring apparatus and a measuring method are provided. The measuring apparatus includes an optical system to condense light, a light receiving device to receive light condensed by the optical system at a plurality of light receiving positions and convert the light into an electric signal, a plurality of optical band-pass filters arranged near a lens stop of the optical system, each of the optical band-pass filters having a different spectral transmittance, a lens array arranged between the optical system and the light receiving device, the lens array having a plurality of lenses each of which is arranged substantially in parallel with a two-dimensional surface of the light receiving device, and a correction unit to correct the electric signal for each one of the plurality of light receiving positions of the light receiving device. The measuring method is performed by the measuring apparatus.
申请公布号 US2014375994(A1) 申请公布日期 2014.12.25
申请号 US201414293039 申请日期 2014.06.02
申请人 YAMANAKA Yuji;MARUYAMA Go;MASUDA Kensuke;NAGAI Sho 发明人 YAMANAKA Yuji;MARUYAMA Go;MASUDA Kensuke;NAGAI Sho
分类号 G01J1/04 主分类号 G01J1/04
代理机构 代理人
主权项 1. A measuring apparatus comprising: an optical system to condense light; a light receiving device to receive light condensed by the optical system at a plurality of light receiving positions and convert the light into an electric signal; a plurality of optical band-pass filters arranged near a lens stop of the optical system, each of the optical band-pass filters having a different spectral transmittance; a lens array arranged between the optical system and the light receiving device, the lens array having a plurality of lenses each of which is arranged substantially in parallel with a two-dimensional surface of the light receiving device; and a correction unit to correct the electric signal for each one of the plurality of light receiving positions of the light receiving device.
地址 Kanagawa JP