发明名称 SENSITIVITY CORRECTION METHOD FOR DOSE MONITORING DEVICE AND PARTICLE BEAM THERAPY SYSTEM
摘要 In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured; the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber; and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
申请公布号 US2014374624(A1) 申请公布日期 2014.12.25
申请号 US201414478143 申请日期 2014.09.05
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 OTANI Toshihiro;HARADA Hisashi;IKEDA Masahiro;HANAKAWA Kazushi;HONDA Taizo
分类号 H01J37/304;A61N5/10;H01J47/02 主分类号 H01J37/304
代理机构 代理人
主权项 1. A sensitivity correction method for a dose monitoring device included in a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject, the sensitivity correction method comprising the steps of: measuring, by said dose monitoring device, the dose of the particle beam passing through said dose monitoring device; measuring, by a small ionization chamber that is smaller in size than said dose monitoring device, the dose of the particle beam that passes through said dose monitoring device, wherein said small ionization chamber is located downstream of said dose monitoring device with respect to the traveling direction of the particle beam; and calculating, by a calculation unit, a correction coefficient of the dose measured by said dose monitoring device corresponding to the irradiation position based on the dose of the particle beam measured by said small ionization chamber, for improving measurement deterioration due to deflection of an electrode of the dose monitoring device.
地址 Chiyoda-ku JP