Method and Apparatus for the Application of Force to a Sample for Detection Using an Electromechanical Means

摘要

The embodiments of the present invention are directed to applying intimate contact pressures to samples while undergoing ATR infrared interrogation. As a general mode of operation, after a solid sample is placed on the ATR element, a force actuator moves an anvil arm to apply a contact force to the sample against the ATR. Thereafter, when the scan is over, the user can see the result of the one or more scans. The force actuator may be a motor or a solenoid or other type of force actuator. The applied contact force may be a fixed force or may be a user-selectable force or may be automatically controlled through feedback from the spectrometer based on the spectroscopic signature of the sample material.

主权项

1. A handheld internal reflection apparatus, comprising:
a handheld enclosure; an internally reflective element disposed in the handheld enclosure and also configured to provide a sample contact surface external to the handheld enclosure; an optical assembly contained within the handheld enclosure, the optical assembly further comprising a radiation source and a radiation detector, the source being configured to direct radiation towards the sample contact surface and the detector being configured to detect the source radiation optically interacting with the sample contact surface; a sample contact arm; a force actuator coupled to the sample contact arm; and a processor also configured within the handheld enclosure and electronically coupled to the force actuator, the radiation source, and the radiation detector; wherein the processor directs the force actuator with a controlled contact force as applied to a sample disposed between the sample contact arm and the sample contact surface, wherein after the controlled contact force is met, the electronic processor analyzes the sample information received by the radiation detector.