发明名称 |
SOLID-STATE IMAGING DEVICE |
摘要 |
According to one embodiment, a solid-state imaging device includes a pixel array unit having pixels in a matrix form to store charge obtained by photoelectric conversion; a reference voltage generation circuit configured to generate a reference voltage based on an inter-terminal voltage of a first capacitor; and a column ADC circuit configured to calculate an AD conversion value of a pixel signal read out from each of the pixels on the basis of a result of comparison between the pixel signal and the reference voltage, the first capacitor comprising:
a first nonlinear capacitance; and a second nonlinear capacitance connected in parallel with the first nonlinear capacitance to have a polarity opposite to that of the first nonlinear capacitance. |
申请公布号 |
US2014374571(A1) |
申请公布日期 |
2014.12.25 |
申请号 |
US201314107152 |
申请日期 |
2013.12.16 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Okamoto Ryuta |
分类号 |
H01L27/146;H04N5/335 |
主分类号 |
H01L27/146 |
代理机构 |
|
代理人 |
|
主权项 |
1. A solid-state imaging device comprising:
a pixel array unit having pixels in a matrix form to store charge obtained by photoelectric conversion; a reference voltage generation circuit configured to generate a reference voltage based on an inter-terminal voltage of a first capacitor; and a column ADC circuit configured to calculate an AD conversion value of a pixel signal read out from each of the pixels on the basis of a result of comparison between the pixel signal and the reference voltage, the first capacitor comprising: a first nonlinear capacitance; and a second nonlinear capacitance connected in parallel with the first nonlinear capacitance to have a polarity opposite to that of the first nonlinear capacitance. |
地址 |
Minato-ku JP |