发明名称 基板処理装置、基板処理方法及び記憶媒体
摘要 Disclosed is a substrate processing apparatus in which a liquid state raw material is maintained at a high-temperature and high-pressure fluid state by a cooling mechanism at a first raw material receiving unit, a supplying valve of a raw material supplying path is opened to provide the high-temperature and high-pressure fluid to a processing chamber where a target substrate is disposed, and the target substrate is dried by the high-temperature and high-pressure fluid. A second raw material receiving unit is cooled down below a condensation temperature of the raw material by a second cooling mechanism, the high-temperature and high-pressure fluid in the processing chamber is collected at the second raw material receiving unit by opening a collecting valve. The collected raw material is re-utilized as a raw material supplied from the first raw material receiving unit to the processing chamber.
申请公布号 JP5644219(B2) 申请公布日期 2014.12.24
申请号 JP20100158013 申请日期 2010.07.12
申请人 发明人
分类号 H01L21/304;H01L21/027;H01L21/306 主分类号 H01L21/304
代理机构 代理人
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