发明名称 Semiconductor device having fin-shaped field effect transistor and manufacturing method thereof
摘要 Disclosed is a semiconductor device including: an active region defined by an element isolation region; a gate trench going across the active region to define source/drain regions on both sides thereof, respectively, and to define, between the source/drain regions, the channel region having a first, second, and third protruding portions which are arranged in a gate width direction; and a gate electrode formed in the gate trench so as to cover the channel region through a gate insulating film.
申请公布号 US8916918(B2) 申请公布日期 2014.12.23
申请号 US201213439274 申请日期 2012.04.04
申请人 PS4 Luxco S.A.R.L. 发明人 Nishi Hiroo;Oshima Hiromitsu
分类号 H01L27/108 主分类号 H01L27/108
代理机构 Young & Thompson 代理人 Young & Thompson
主权项 1. A semiconductor device comprising: an active region defined by an element isolation region; a gate trench crossing the active region to define source and drain regions on both sides thereof, respectively, and to define a channel region between the source and drain regions, the channel region having a first, second, and third protruding portions arranged in a gate width direction, the third protruding portion being between the first and second protruding portions to define a fin-shaped channel portion and giving the channel region a substantially W-shape; and a gate electrode formed in the gate trench so as to cover the channel region with an intervention of a gate insulating film.
地址 Luxembourg LU