发明名称 |
Semiconductor device having fin-shaped field effect transistor and manufacturing method thereof |
摘要 |
Disclosed is a semiconductor device including: an active region defined by an element isolation region; a gate trench going across the active region to define source/drain regions on both sides thereof, respectively, and to define, between the source/drain regions, the channel region having a first, second, and third protruding portions which are arranged in a gate width direction; and a gate electrode formed in the gate trench so as to cover the channel region through a gate insulating film. |
申请公布号 |
US8916918(B2) |
申请公布日期 |
2014.12.23 |
申请号 |
US201213439274 |
申请日期 |
2012.04.04 |
申请人 |
PS4 Luxco S.A.R.L. |
发明人 |
Nishi Hiroo;Oshima Hiromitsu |
分类号 |
H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
Young & Thompson |
代理人 |
Young & Thompson |
主权项 |
1. A semiconductor device comprising:
an active region defined by an element isolation region; a gate trench crossing the active region to define source and drain regions on both sides thereof, respectively, and to define a channel region between the source and drain regions, the channel region having a first, second, and third protruding portions arranged in a gate width direction, the third protruding portion being between the first and second protruding portions to define a fin-shaped channel portion and giving the channel region a substantially W-shape; and a gate electrode formed in the gate trench so as to cover the channel region with an intervention of a gate insulating film. |
地址 |
Luxembourg LU |