发明名称 X-ray detector panel
摘要 An X-ray detector panel comprises: a substrate; a transistor including a gate electrode disposed on the substrate, a gate insulating layer disposed on the gate electrode, an active layer disposed on the gate insulating layer, and a source electrode and a drain electrode disposed on the active layer and separated from each other; a photodiode including a first electrode connected to the drain electrode of the transistor, a photoconductive layer disposed on the first electrode, and a second electrode disposed on the photoconductive layer; an interlayer insulating layer including a first interlayer insulating layer covering the transistor and the photodiode, the first interlayer insulating layer being formed of an insulating material having a band gap energy of about 8 eV to about 10 eV; a data line disposed on the interlayer insulating layer and contacting the source electrode of the transistor via the interlayer insulating layer; a bias line disposed on the interlayer insulating layer and contacting the second electrode of the photodiode via the interlayer insulating layer; and a passivation layer disposed on the data line, the bias line, and the interlayer insulating layer.
申请公布号 US8916830(B2) 申请公布日期 2014.12.23
申请号 US201113175097 申请日期 2011.07.01
申请人 Samsung Display Co., Ltd. 发明人 Lim James;Jung Kwan-Wook;Kim Dong-Hyuk;Ryu Jea-Eun
分类号 H01L27/146;G01T1/20;G01T1/24;G01T1/29 主分类号 H01L27/146
代理机构 代理人 Bushnell, Esq. Robert E.
主权项 1. An X-ray detector panel, comprising: a substrate; a transistor including a gate electrode disposed on the substrate, a gate insulating layer disposed on the gate electrode, an active layer disposed on the gate insulating layer, and a source electrode and a drain electrode disposed on the active layer and separated from each other; a photodiode including a first electrode connected to the drain electrode of the transistor, a photoconductive layer disposed on the first electrode, and a second electrode disposed on the photoconductive layer; an interlayer insulating layer including a first interlayer insulating layer covering the transistor and the photodiode, the first interlayer insulating layer being formed of an insulating material having a band gap energy in a range of about 8 eV to about 10 eV; a data line disposed on the interlayer insulating layer and contacting the source electrode of the transistor via the interlayer insulating layer; a bias line disposed on the interlayer insulating layer and contacting the second electrode of the photodiode via the interlayer insulating layer; and a passivation layer disposed on the data line, the bias line, and the interlayer insulating layer; the interlayer insulating layer further comprising a second interlayer insulating layer disposed on the first interlayer insulating layer, the second interlayer insulating layer being formed of an insulating material having a band gap energy in a range of about 3 eV to about 10 eV.
地址 Giheung-Gu, Yongin, Gyeonggi-Do KR