发明名称 |
Non-uniform channel junction-less transistor |
摘要 |
The present disclosure discloses a method of forming a semiconductor layer on a substrate. The method includes patterning the semiconductor layer into a fin structure. The method includes forming a gate dielectric layer and a gate electrode layer over the fin structure. The method includes patterning the gate dielectric layer and the gate electrode layer to form a gate structure in a manner so that the gate structure wraps around a portion of the fin structure. The method includes performing a plurality of implantation processes to form source/drain regions in the fin structure. The plurality of implantation processes are carried out in a manner so that a doping profile across the fin structure is non-uniform, and a first region of the portion of the fin structure that is wrapped around by the gate structure has a lower doping concentration level than other regions of the fin structure. |
申请公布号 |
US8916444(B2) |
申请公布日期 |
2014.12.23 |
申请号 |
US201313941199 |
申请日期 |
2013.07.12 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Goto Ken-Ichi;Wu Zhiqiang |
分类号 |
H01L21/336;H01L29/66;G01N33/68;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method of fabricating a semiconductor device, comprising:
forming a semiconductor layer on a substrate; patterning the semiconductor layer into a fin structure; forming a gate dielectric layer and a gate electrode layer over the fin structure; patterning the gate dielectric layer and the gate electrode layer to form a gate structure in a manner so that the gate structure wraps around a portion of the fin structure; and performing a plurality of implantation processes to form source/drain regions in the fin structure, the plurality of implantation processes being carried out in a manner so that a doping profile across the fin structure is non-uniform including a first region having a first doping concentration level, a second region extending from the first region and partially wrapped around by the gate structure and having a second doping concentration level that is different than the first doping concentration level, and a third region extending from the second region but not wrapped around by the gate structure and having a third doping concentration level that is different than the second doping concentration level, wherein the first, second, and third regions all have the same doping polarity. |
地址 |
Hsin-Chu TW |