发明名称 Non-uniform channel junction-less transistor
摘要 The present disclosure discloses a method of forming a semiconductor layer on a substrate. The method includes patterning the semiconductor layer into a fin structure. The method includes forming a gate dielectric layer and a gate electrode layer over the fin structure. The method includes patterning the gate dielectric layer and the gate electrode layer to form a gate structure in a manner so that the gate structure wraps around a portion of the fin structure. The method includes performing a plurality of implantation processes to form source/drain regions in the fin structure. The plurality of implantation processes are carried out in a manner so that a doping profile across the fin structure is non-uniform, and a first region of the portion of the fin structure that is wrapped around by the gate structure has a lower doping concentration level than other regions of the fin structure.
申请公布号 US8916444(B2) 申请公布日期 2014.12.23
申请号 US201313941199 申请日期 2013.07.12
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Goto Ken-Ichi;Wu Zhiqiang
分类号 H01L21/336;H01L29/66;G01N33/68;H01L29/78 主分类号 H01L21/336
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method of fabricating a semiconductor device, comprising: forming a semiconductor layer on a substrate; patterning the semiconductor layer into a fin structure; forming a gate dielectric layer and a gate electrode layer over the fin structure; patterning the gate dielectric layer and the gate electrode layer to form a gate structure in a manner so that the gate structure wraps around a portion of the fin structure; and performing a plurality of implantation processes to form source/drain regions in the fin structure, the plurality of implantation processes being carried out in a manner so that a doping profile across the fin structure is non-uniform including a first region having a first doping concentration level, a second region extending from the first region and partially wrapped around by the gate structure and having a second doping concentration level that is different than the first doping concentration level, and a third region extending from the second region but not wrapped around by the gate structure and having a third doping concentration level that is different than the second doping concentration level, wherein the first, second, and third regions all have the same doping polarity.
地址 Hsin-Chu TW