Semiconductor memory device and method of testing the same

摘要

A semiconductor memory device includes a write controller configured to transmit a first input data that is supplied through a first pad, to a first global I/O line and a second global I/O line when a write operation is executed in a test mode. The semiconductor memory device further includes a first write driver configured to store the first input data via the first global I/O line in a first cell block when the write operation is executed in the test mode. The semiconductor memory device further includes a first I/O line driver configured to supply signals to the first global I/O line and a first test I/O line in response to a first output data supplied from the first cell block when a read operation is executed in the test mode.

主权项

1. A semiconductor memory device comprising:
a write controller configured to transmit a first input data from a first pad to a first global I/O line and a second global I/O line when a write operation is executed during a test mode; a first write driver configured to transfer the first input data from the first global I/O line to a first cell block so as to cause the first input data to be stored in the first cell block when the write operation is executed during the test mode; and a first I/O line driver configured to supply signals to the first global I/O line and to a first test I/O line in response to receiving a first output data from the first cell block when a read operation is executed during the test mode.