发明名称 MIM capacitor with plate having high melting point
摘要 A method for producing an integrated device including an MIM capacitor. The method includes the steps of providing a functional substrate including functional circuits of the integrated device, forming a first conductive layer including a first plate of the capacitor on the functional substrate; the first plate has a first melting temperature. The method further includes depositing a layer of insulating material including a dielectric layer of the capacitor on a portion of the first conductive layer corresponding to the first plate; the layer of insulating material is deposited at a process temperature being lower than the first melting temperature. The method further includes forming a second conductive layer including a second plate of the capacitor on a portion of the layer of insulating material corresponding to the dielectric layer. In the solution according to an embodiment of the invention, the first melting temperature is higher than 500° C.
申请公布号 US8916436(B2) 申请公布日期 2014.12.23
申请号 US201012972606 申请日期 2010.12.20
申请人 STMicroelectronics S.r.l. 发明人 Dundulachi Alessandro;Molfese Antonio
分类号 H01L21/8242;H01L49/02 主分类号 H01L21/8242
代理机构 Gardere Wynne Sewell LLP 代理人 Gardere Wynne Sewell LLP
主权项 1. A method for producing an integrated device including an MIM capacitor, the method including the steps acts of: providing a functional substrate including functional circuits of the integrated device, forming a first conductive layer including a first plate of the capacitor on the functional substrate, the first plate having a first melting temperature, depositing a layer of insulating material including a dielectric layer of the capacitor on a portion of the first conductive layer corresponding to the first plate, the layer of insulating material being deposited at a process temperature being greater than approximately 400° C. and lower than the first melting temperature, forming a second conductive layer including a second plate of the capacitor on a portion of the layer of insulating material corresponding to the dielectric layer, wherein the first melting temperature is higher than 500° C., and wherein the second conductive layer further includes functional connections to the functional circuits, the method further including the steps of: forming a protective layer of insulating material covering the second plate and the functional connections;forming a first contact for contacting the first plate through the functional protective layer; andforming a second contact and functional contacts for contacting the second plate and the functional connections, respectively, through the protective layer.
地址 Agrate Brianza (MB) IT