发明名称 FAULTY HANGER TEST APPARATUS
摘要 <p>The present invention relates to a faulty hanger test apparatus. The faulty hanger test apparatus according to the present invention includes a supporting frame in which a hanger of an electrical plating device is mounted and a location sensing unit which is located in the supporting frame and senses the position of the hanger. An aspect of the present invention is to provide the faulty hanger test apparatus measuring structural properties and electrical properties of the hanger of the electrical plating device to inspect a fault hanger.</p>
申请公布号 KR20140145426(A) 申请公布日期 2014.12.23
申请号 KR20130067868 申请日期 2013.06.13
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM, KWANG MYUNG;LEE, JAE CHAN;JUNG, YONG CHAN
分类号 C25D21/12;C25D7/12;C25D17/06;H05K3/18 主分类号 C25D21/12
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