发明名称 Nonvolatile semiconductor memory device
摘要 According to one embodiment, a nonvolatile semiconductor memory device comprises a semiconductor substrate, memory strings formed above the semiconductor substrate, and a control circuit configured to control voltages applied to the memory cells. In a read operation, when the control circuit precharges a first source line electrically connected to a selected memory string to a first voltage, the control circuit precharges a second source line electrically connected to an unselected memory string to a second voltage, the second voltage being higher than the first voltage, and after the second source line is precharged, the control circuit precharges a first bit line electrically connected to the selected memory string to the second voltage.
申请公布号 US8917557(B2) 申请公布日期 2014.12.23
申请号 US201213715317 申请日期 2012.12.14
申请人 Kabushiki Kaisha Toshiba 发明人 Sakaguchi Natsuki;Maejima Hiroshi
分类号 G11C11/34;G11C16/10;G11C16/04;G11C16/24;G11C16/26;G11C7/06 主分类号 G11C11/34
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A nonvolatile semiconductor memory device comprising: a semiconductor substrate; memory strings formed above the semiconductor substrate, each memory string including a plurality of memory cells, a part of memory cells being configured to stacked above the semiconductor substrate; and a control circuit configured to control a plurality of voltages applied to the memory cells, wherein in a read operation, when the control circuit precharges a first source line electrically connected to a selected memory string to a first voltage, the control circuit precharges a second source line electrically connected to an unselected memory string to a second voltage, the second voltage being higher than the first voltage, and after the second source line is precharged, the control circuit precharges a first bit line electrically connected to the selected memory string to the second voltage.
地址 Tokyo JP