发明名称 AUTOMATIC INSTRUMENTATION APPARATUS AND METHOD FOR AUTOMATIC INSTRUMENTATION
摘要 <p>The present invention relates to an automatic measuring device and a method thereof. The automatic measuring device includes a plurality of measuring devices which concurrently measures different measuring points of a measuring target according to a predetermined schedule to generate coordinates of the different measuring points; and a control unit which controls the measuring devices to concurrently measure measuring points according to the schedule, and generates measurement data about the target by using the coordinates generated by each measuring device.</p>
申请公布号 KR20140144978(A) 申请公布日期 2014.12.22
申请号 KR20130067280 申请日期 2013.06.12
申请人 SAMSUNG HEAVY IND. CO., LTD. 发明人 CHA, JI HYE;PARK, JIN HYUNG
分类号 G01B11/16;B63B9/06;G01B11/03 主分类号 G01B11/16
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