发明名称 PLASMA PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要 Provided are a plasma processing method and a substrate processing apparatus. The plasma processing method includes mounting at least one first plasma source and at least one second plasma source on a chamber, supplying a first gas to the first plasma source, supplying a second gas different from the first gas to the second plasma source, applying power to the first plasma source to generate first plasma, applying power to the second plasma source to generate second plasma, and processing a substrate disposed inside the chamber using the first and second plasma.
申请公布号 US2014370715(A1) 申请公布日期 2014.12.18
申请号 US201414472781 申请日期 2014.08.29
申请人 WINTEL CO., LTD. 发明人 CHUNG Seng-Hyun;LEE Hyang-Joo
分类号 B81C1/00;H01L21/67 主分类号 B81C1/00
代理机构 代理人
主权项 1. A plasma processing method comprising: mounting one or more first plasma sources and one or more second plasma sources on a chamber; supplying a first gas to the first plasma sources; supplying a second gas different from the first gas to the second plasma sources; applying power to the first plasma sources to generate first plasma; applying power to the second plasma sources to generate second plasma; and processing a substrate disposed inside the chamber using the first plasma and the second plasma.
地址 Hwaseong-si KR