发明名称 SAFT ANALYSIS OF DEFECTS CLOSE TO THE SURFACE
摘要 The invention relates to a method and a device for the ultrasonic testing of test objects by means of a test head. A computer device directly acquires, during a SAFT analysis for determining points in time of the amplitudes to be summed up from among the image time signals, a propagation time, which depends on the test head, from the test head positioned at a measuring point to the location of the voxel and uses same.
申请公布号 CA2915303(A1) 申请公布日期 2014.12.18
申请号 CA20142915303 申请日期 2014.01.16
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 MOOSHOFER, HUBERT
分类号 G01N29/06;G01N29/44 主分类号 G01N29/06
代理机构 代理人
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