发明名称 ELECTRONIC CONTROL DEVICE HAVING INTEGRATED CIRCUIT ELEMENT AND SINGLE ITEM INSPECTION DEVICE OF THE INTEGRATED CIRCUIT ELEMENT
摘要 <p>PROBLEM TO BE SOLVED: To provide an inexpensive electronic control device capable of performing a hardware check at every activation and stop of the electronic control device.SOLUTION: A monitoring control circuit part 130A being an integrated circuit element mounted on an electronic control device 100A includes a self-testing circuit 200 comprising a BIST control block 210, scan chain circuits 217, 220, 230, 240, 250 and a mask circuit 260, and uses the BIST control block 210 to perform self-test by a partially organized scan chain circuits 220, 230, 240 during starting operation. During single item shipping inspection of the integrated circuit element, a microprocessor for inspection performs an external test by an entirely organized scan chain circuit. A portion of a scan chain circuit included for single item inspection is utilized, and a scan test as the electronic control device can be performed with an inexpensive configuration.</p>
申请公布号 JP2014238348(A) 申请公布日期 2014.12.18
申请号 JP20130121439 申请日期 2013.06.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 IWAGAMI YUUKI;TANAKA SUSUMU
分类号 G01R31/28;H01L21/822;H01L27/04 主分类号 G01R31/28
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