发明名称 |
METHOD FOR COMPUTER-AIDED SIMULATION OF ATOMIC-RESOLUTION SCANNING THERMOELECTRIC MICROSCOPE |
摘要 |
<p>The present invention relates to a method for the computer-aided simulation of an atomic-resolution scanning thermoelectric microscope and, more particularly, to a simulation method in which a computer calculates a thermoelectric voltage V for displaying an atomic-level image of a predetermined local area of a material.</p> |
申请公布号 |
WO2014200140(A1) |
申请公布日期 |
2014.12.18 |
申请号 |
WO2013KR06267 |
申请日期 |
2013.07.12 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM, YONGHYUN;LYEO, HOKI;LEE, EUISUP |
分类号 |
G01Q30/04;G06F19/00 |
主分类号 |
G01Q30/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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