发明名称 |
DEFECT INSPECTION SYSTEM |
摘要 |
<p>This defect inspection system is provided with: a transport line for transporting a film of elongated strip form; a defect inspection device for conducting defect inspection of the film transported by the transport line; and a recording device (13) for recording defect information based on the result of the defect inspection, onto the film (F105) transported by the transport line. The recording device (13) has a print head (13a) for ejecting ink (i) onto a recording area (S) at an edge portion of the film (F105) to record defect information therein, and a cover (30) for preventing the ink (i) from becoming deposited in an area at least to the inward side from the recording area (S) of the film (F105).</p> |
申请公布号 |
WO2014199952(A1) |
申请公布日期 |
2014.12.18 |
申请号 |
WO2014JP65231 |
申请日期 |
2014.06.09 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
SUEMATSU RYOKO;IMURA KEITA |
分类号 |
G01N21/892;G02B5/30;G02F1/13 |
主分类号 |
G01N21/892 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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