发明名称 DEFECT INSPECTION SYSTEM
摘要 <p>This defect inspection system is provided with: a transport line for transporting a film of elongated strip form; a defect inspection device for conducting defect inspection of the film transported by the transport line; and a recording device (13) for recording defect information based on the result of the defect inspection, onto the film (F105) transported by the transport line. The recording device (13) has a print head (13a) for ejecting ink (i) onto a recording area (S) at an edge portion of the film (F105) to record defect information therein, and a cover (30) for preventing the ink (i) from becoming deposited in an area at least to the inward side from the recording area (S) of the film (F105).</p>
申请公布号 WO2014199952(A1) 申请公布日期 2014.12.18
申请号 WO2014JP65231 申请日期 2014.06.09
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 SUEMATSU RYOKO;IMURA KEITA
分类号 G01N21/892;G02B5/30;G02F1/13 主分类号 G01N21/892
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