发明名称 |
SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING SOLID-STATE IMAGING DEVICE, AND ELECTRONIC APPARATUS |
摘要 |
There is provided a solid-state imaging device including plural pixel regions, each including a pixel having a photoelectric conversion unit, a color filter, and a microlens that condenses the incident light to the photoelectric conversion unit; a first light shielding portion that has a first end face at the side of the microlens, and a second end face opposite to the first end face, and that is formed at each side portion of each pixel region of the plurality of the pixel regions; and a second light shielding portion that has a first end face at the side of the microlens, and a second end face opposite to the first end face, and that is formed at each corner portion of the pixel region, in which a distance from a surface of the pixel to the first end face is short compared to the first light shielding portion. |
申请公布号 |
US2014367821(A1) |
申请公布日期 |
2014.12.18 |
申请号 |
US201414472069 |
申请日期 |
2014.08.28 |
申请人 |
Sony Corporation |
发明人 |
Ootsuka Yoichi |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A solid-state imaging device, comprising:
a semiconductor substrate; a plurality of pixels configured to be located on the semiconductor substrate, each pixel which has a photoelectric conversion unit, a color filter being located over the photoelectric conversion unit and a microlens being located over the photoelectric conversion unit; a light shielding film configured to be located between the color filters; and a film configured to be located between the color filter and the light shielding film. |
地址 |
Tokyo JP |