| 摘要 |
<p>The present invention relates to a contact probe comprising a first plunger which is in contact with an examined contact point of an examined object, and a second plunger which is in contact with an examination contact point of an examination circuit. The first plunger or the second plunger includes a column unit which is extended with an approximately certain cross-section and a single contact unit which is extended from the column unit as the cross-section is getting reduced and has a most tip end that is in contact with the examined contact point or the examination contact point, wherein the external surface of the contact unit formed between a start point (S) of the extended column unit and the most tip ends (T) of the contact unit is formed to be more curved than a conical surface formed by a virtual linear line (ST) to connect the start point (S) and the most tip end (T). The contact probe having the contact unit is able to maintain sharpness for a long time and reduce accumulation of foreign materials even though the contact unit is worn out in a test, thereby increasing lifespan.</p> |
